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导电聚合物的电化学。45. 通过电流感应原子力显微镜研究 PEDOT 和 PEDOT:PSS 复合薄膜的纳米级电导率。

Electrochemistry of conductive polymers. 45. Nanoscale conductivity of PEDOT and PEDOT:PSS composite films studied by current-sensing AFM.

机构信息

Department of Chemistry, Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Korea, ROK.

出版信息

J Phys Chem B. 2010 Mar 4;114(8):2660-6. doi: 10.1021/jp9113859.

Abstract

[Poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)] (PEDOT:PSS, Baytron P) composite films were prepared under various conditions and their conductivities were studied by the current-sensing atomic force microscopy (CS-AFM) technique. Topographic and current images of pristine and additive-treated PEDOT:PSS as well as electrochemically synthesized PEDOT films were obtained in nanoscale using the CS-AFM. The as-prepared pristine PEDOT:PSS films showed a low population of conductive spots isolated by large insulating regions; both their population and the conductivities increased upon addition of a few additives to the PEDOT:PSS solution before spin-coating. From the current-voltage (I-V) traces recorded at a few representative spots of different electronic states, much improved pathways for charge percolation appeared to have been established in the additive-treated films. Electrochemically prepared PEDOT films showed much better electrical properties compared with spin-casted films of chemically prepared polymers. The conductivity of all these films was shown to be significantly enhanced by the electrochemical doping process.

摘要

[聚(3,4-亚乙基二氧噻吩):聚(苯乙烯磺酸盐)](PEDOT:PSS,Baytron P)复合膜在各种条件下进行制备,并通过电流感应原子力显微镜(CS-AFM)技术研究其电导率。使用 CS-AFM 在纳米尺度上获得了原始和添加剂处理的 PEDOT:PSS 以及电化学合成的 PEDOT 膜的形貌和电流图像。未经处理的 PEDOT:PSS 薄膜显示出由大的绝缘区域隔开的低导电点的存在;在旋涂之前,将少量添加剂添加到 PEDOT:PSS 溶液中,其数量和电导率均增加。从在不同电子状态的几个代表性点记录的电流-电压(I-V)迹线可以看出,在添加剂处理的薄膜中似乎已经建立了电荷渗流的改进途径。与化学制备聚合物的旋涂薄膜相比,电化学制备的 PEDOT 薄膜具有更好的电学性能。电化学掺杂过程显著提高了所有这些薄膜的电导率。

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