Deng Suhui, Liu Li, Cheng Ya, Li Ruxin, Xu Zhizhan
State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, China.
Opt Express. 2010 Jan 18;18(2):1657-66. doi: 10.1364/OE.18.001657.
Effects of primary aberrations including spherical aberration, coma and astigmatism on the three fluorescence depletion patterns mainly used in stimulated emission of depletion (STED) microscopy are investigated by using vectorial integral. The three depletion patterns are created by inserting a vortex phase plate, a central half-wavelength plate or a semi-circular half-wavelength mask within Gaussian beam respectively. Attention is given to the modification of the shape, peak intensity, the central intensity of the dark hole and the hole size of these depletion patterns in the presence of primary aberrations.
通过使用矢量积分，研究了包括球差、彗差和像散在内的初级像差对受激辐射损耗（STED）显微镜中主要使用的三种荧光损耗模式的影响。这三种损耗模式分别是通过在高斯光束中插入涡旋相位板、中心半波长板或半圆形半波长掩膜产生的。重点关注了在存在初级像差的情况下，这些损耗模式的形状、峰值强度、暗孔中心强度和孔尺寸的变化。
