Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK.
J Synchrotron Radiat. 2010 Mar;17(2):237-42. doi: 10.1107/S0909049509055009. Epub 2010 Jan 16.
In this paper the first practical application of kinoform lenses for the X-ray reflectivity characterization of thin layered materials is demonstrated. The focused X-ray beam generated from a kinoform lens, a line of nominal size approximately 50 microm x 2 microm, provides a unique possibility to measure the X-ray reflectivities of thin layered materials in sample scanning mode. Moreover, the small footprint of the X-ray beam, generated on the sample surface at grazing incidence angles, enables one to measure the absolute X-ray reflectivities. This approach has been tested by analyzing a few thin multilayer structures. The advantages achieved over the conventional X-ray reflectivity technique are discussed and demonstrated by measurements.
本文首次展示了用于薄层层状材料 X 射线反射率特性描述的菲涅耳透镜的实际应用。从菲涅耳透镜产生的聚焦 X 射线束，其标称尺寸约为 50 微米 x 2 微米，为薄层层状材料的样品扫描模式下的 X 射线反射率测量提供了独特的可能性。此外，在掠入射角下，在样品表面上产生的小尺寸 X 射线束，使得能够测量绝对 X 射线反射率。该方法已经通过分析几种薄多层结构进行了测试。通过测量讨论并证明了与传统 X 射线反射率技术相比所获得的优势。
