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受激发射损耗显微镜性能的分析描述。

Analytical description of STED microscopy performance.

作者信息

Leutenegger Marcel, Eggeling Christian, Hell Stefan W

机构信息

Department of NanoBiophotonics, Max Planck Institute for Biophysical Chemistry, Am Fassberg 11, 37077 Göttingen, Germany.

出版信息

Opt Express. 2010 Dec 6;18(25):26417-29. doi: 10.1364/OE.18.026417.

DOI:10.1364/OE.18.026417
PMID:21164992
Abstract

Stimulated emission depletion (STED) resolves fluorescent features that are closer than the far-field optical diffraction limit by applying a spatially modulated light field keeping all but one of these features dark consecutively. For estimating the efficiency of transient fluorophore darkening, we developed analytical equations considering the spatio-temporal intensity profile of the STED beam. These equations provide a quick analysis and optimization of the resolution and contrast to be gained under various conditions, such as continuous wave or pulsed STED beams having different pulse durations. Particular emphasis is placed on fluorescence fluctuation methods such as correlation spectroscopy (FCS) using STED.

摘要

受激发射损耗(STED)通过应用空间调制光场,使除一个荧光特征外的所有其他特征连续保持暗态,从而分辨出比远场光学衍射极限更近的荧光特征。为了估计瞬态荧光团暗化的效率,我们考虑STED光束的时空强度分布,开发了分析方程。这些方程能快速分析和优化在各种条件下(如具有不同脉冲持续时间的连续波或脉冲STED光束)可获得的分辨率和对比度。特别强调了使用STED的荧光涨落方法,如相关光谱法(FCS)。

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Analytical description of STED microscopy performance.受激发射损耗显微镜性能的分析描述。
Opt Express. 2010 Dec 6;18(25):26417-29. doi: 10.1364/OE.18.026417.
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