Hiranaga Yoshiomi, Cho Yasuo
Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan.
Rev Sci Instrum. 2010 Feb;81(2):023705. doi: 10.1063/1.3274138.
Intermittent contact scanning nonlinear dielectric microscopy (IC-SNDM) was developed as a novel technique for surface topography measurements and observation of domain structures. Domain structures on ferroelectric single crystals were observed with nanoscale resolution using IC-SNDM. The reproducibility of measurements was improved in comparison to a conventional SNDM operated under contact mode, because the tip and/or sample damage are reduced when using intermittent contact mode. The minimum loading force of the probe to provide basic performance was experimentally determined for IC-SNDM.
间歇接触扫描非线性介电显微镜（IC-SNDM）是作为一种用于表面形貌测量和畴结构观察的新技术而开发的。利用IC-SNDM以纳米级分辨率观察了铁电单晶上的畴结构。与在接触模式下操作的传统SNDM相比，测量的重现性得到了提高，因为在使用间歇接触模式时，针尖和/或样品损伤减少。通过实验确定了IC-SNDM提供基本性能所需探针的最小加载力。
