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单脉冲探测与中红外脉冲载波相位漂移的直接控制。

Single-shot detection and direct control of carrier phase drift of midinfrared pulses.

机构信息

Max Planck Research Group for Structural Dynamics, University of Hamburg, Center for Free Electron Laser Science, c/o DESY, Notkestrasse, 85-22607 Hamburg, Germany.

出版信息

Opt Lett. 2010 Mar 1;35(5):757-9. doi: 10.1364/OL.35.000757.

Abstract

We introduce a scheme for single-shot detection and correction of the carrier-envelope phase (CEP) drift of femtosecond pulses at mid-IR wavelengths. Difference frequency mixing between the mid-IR field and a near-IR gate pulse generates a near-IR frequency-shifted pulse, which is then spectrally interfered with a replica of the gate pulse. The spectral interference pattern contains shot-to-shot information of the CEP of the mid-IR field, and it can be used for simultaneous correction of its slow drifts. We apply this technique to detect and compensate long-term phase drifts at 17 microm wavelength, reducing fluctuations to only 110 mrad over hours of operation.

摘要

我们提出了一种用于单次检测和校正中红外波长飞秒脉冲载波包络相位(CEP)漂移的方案。中红外场与近红外门脉冲之间的差频混合会产生近红外频移脉冲,然后该脉冲与门脉冲的复制品进行光谱干涉。光谱干涉图案包含中红外场的 CEP 的逐拍信息,可用于其慢漂移的同时校正。我们将该技术应用于检测和补偿 17 微米波长的长周期相位漂移,在数小时的运行过程中,将波动降低到仅 110 毫弧度。

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