Applied Physics Department and the Center for Nano Science and Nanotechnology, The Hebrew University, Jerusalem 91904, Israel.
Phys Rev Lett. 2010 Jan 8;104(1):016804. doi: 10.1103/PhysRevLett.104.016804. Epub 2010 Jan 6.
A collective electron transfer (ET) process was discovered by studying the current noise in a field effect transistor with light-sensitive gate formed by nanocrystals linked by organic molecules to its surface. Fluctuations in the ET through the organic linker are reflected in the fluctuations of the transistor conductivity. The current noise has an avalanche character. Critical exponents obtained from the noise power spectra, avalanche distributions, and the dependence of the average avalanche size on avalanche duration are consistent with each other. A plausible model is proposed for this phenomenon.
通过研究由通过有机分子与其表面连接的纳米晶体形成的光敏栅极的场效应晶体管中的电流噪声，发现了集体电子转移（ET）过程。通过有机连接体的 ET 波动反映在晶体管电导率的波动中。电流噪声具有雪崩特性。从噪声功率谱、雪崩分布以及平均雪崩大小对雪崩持续时间的依赖性中获得的临界指数彼此一致。为此现象提出了一个合理的模型。
