Yale University, New Haven, CT 06520-8284, USA.
Adv Mater. 2010 Jul 20;22(26-27):2919-38. doi: 10.1002/adma.200904306.
This review outlines developments in the growth of crystalline oxides on the ubiquitous silicon semiconductor platform. The overall goal of this endeavor is the integration of multifunctional complex oxides with advanced semiconductor technology. Oxide epitaxy in materials systems achieved through conventional deposition techniques is described first, followed by a description of the science and technology of using atomic layer-by-layer deposition with molecular beam epitaxy (MBE) to systematically construct the oxide-silicon interface. An interdisciplinary approach involving MBE, advanced real-space structural characterization, and first-principles theory has led to a detailed understanding of the process by which the interface between crystalline oxides and silicon forms, the resulting structure of the interface, and the link between structure and functionality. Potential applications in electronics and photonics are also discussed.
这篇综述概述了在普遍存在的硅半导体平台上晶体氧化物生长的发展。这项工作的总体目标是将多功能复杂氧化物与先进的半导体技术集成。首先描述了通过传统沉积技术在材料系统中进行氧化物外延的情况,接着描述了使用原子层沉积与分子束外延(MBE)相结合来系统构建氧化物-硅界面的科学和技术。涉及 MBE、先进的实空间结构表征和第一性原理理论的跨学科方法导致了对以下方面的详细理解:晶体氧化物和硅之间的界面形成的过程、界面的结构以及结构和功能之间的联系。还讨论了在电子学和光子学中的潜在应用。