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微分干涉对比显微镜的无样本校准

Sample-less calibration of the differential interference contrast microscope.

作者信息

Mehta Shalin B, Sheppard Colin J R

机构信息

1Optical Bioimaging Lab, Division of Bioengineering, National University of Singapore,Block-E3A, #7-10, 7 Engineering Drive 1, Singapore 117574.

出版信息

Appl Opt. 2010 May 20;49(15):2954-68. doi: 10.1364/AO.49.002954.

DOI:10.1364/AO.49.002954
PMID:20490258
Abstract

Analysis of image formation in a differential interference contrast (DIC) microscope and retrieval of the specimen's properties require calibration of its key parameters, viz. shear and bias. We present a method of measuring the shear and the bias of a DIC microscope from the interference fringes produced in the back focal plane of the objective. Previous approaches, which use calibrated specimens such as polystyrene or fluorescent beads, provide rather approximate measurements of shear or require a complex optical setup. The method presented is accurate, relies on simple image analysis, and does not require a specimen. We provide a succinct and accurate description of properties of Nomarski prisms to explain the rationale behind the method.

摘要

分析微分干涉对比(DIC)显微镜中的图像形成以及获取标本特性需要对其关键参数进行校准,即剪切和偏置。我们提出了一种从物镜后焦平面产生的干涉条纹测量DIC显微镜的剪切和偏置的方法。以前的方法使用诸如聚苯乙烯或荧光珠等校准标本,提供的剪切测量相当近似,或者需要复杂的光学设置。所提出的方法准确,依赖于简单的图像分析,并且不需要标本。我们对诺马斯基棱镜的特性进行了简洁准确的描述,以解释该方法背后的原理。

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