Siqueiros J M, Machorro R, Regalado L E
Appl Opt. 1988 Jun 15;27(12):2549-53. doi: 10.1364/AO.27.002549.
The values of the optical constants of magnesium fluoride (MgF(2)) and zinc sulfide (ZnS) thin films are obtained using a classical oscillator model and the experimental values of their spectral transmittance. Auger electron spectroscopy was performed on the samples to determine the chemical composition of the films. These materials are important in the design of filters, mirrors, and antireflection coatings for optical instrumentation. Unfortunately their properties strongly depend on evaporation conditions. The procedure described here allows direct measurement of the dispersive refractive index of the film after deposition.
利用经典振子模型和氟化镁(MgF₂)及硫化锌(ZnS)薄膜光谱透射率的实验值,得到了它们的光学常数。对样品进行俄歇电子能谱分析以确定薄膜的化学成分。这些材料在光学仪器的滤光片、镜子和减反射涂层设计中很重要。不幸的是,它们的性能强烈依赖于蒸发条件。这里描述的方法允许在薄膜沉积后直接测量其色散折射率。