Li Day-Uei, Walker Richard, Richardson Justin, Rae Bruce, Buts Alex, Renshaw David, Henderson Robert
Institute for Integrated Micro and Nano Systems, School of Engineering, The University of Edinburgh, Edinburgh EH9 3JL, Scotland, UK.
J Opt Soc Am A Opt Image Sci Vis. 2009 Apr;26(4):804-14. doi: 10.1364/josaa.26.000804.
A new integration based fluorescence lifetime imaging microscopy (FLIM) called IEM has been proposed to implement lifetime extraction [J. Opt. Soc. Am. A25, 1190 (2008)]. A real-time hardware implementation of the IEM FLIM algorithm suitable for single photon avalanche diode arrays in nanometer-scale CMOS technology is now proposed. The problems of reduced pixel readout bandwidth and background noise are studied and a calibration method suitable for FPGA implementation is introduced. In particular, the relationship between signal-to-noise ratio and background noise is considered based on statistics theory and compared with a rapid lifetime determination method and maximum-likelihood estimator with-without background correction. The results are also compared with Monte Carlo simulations giving good agreement. The performance of the proposed methods has been tested on monoexponential decay experimental data. The high flexibility, wide range, and hardware friendliness make IEM the best candidate for system-on-chip integration to our knowledge.
一种名为IEM的基于新集成的荧光寿命成像显微镜（FLIM）已被提出用于实现寿命提取[《美国光学学会志A》25，1190（2008）]。现在提出了一种适用于纳米级CMOS技术中单光子雪崩二极管阵列的IEM FLIM算法的实时硬件实现方案。研究了像素读出带宽降低和背景噪声的问题，并引入了一种适用于FPGA实现的校准方法。特别是，基于统计理论考虑了信噪比与背景噪声之间的关系，并与快速寿命测定方法以及有无背景校正的最大似然估计器进行了比较。结果还与蒙特卡罗模拟进行了比较，吻合度良好。所提出方法的性能已在单指数衰减实验数据上进行了测试。据我们所知，高灵活性、宽范围和硬件友好性使IEM成为片上系统集成的最佳候选方案。
