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基于线性光学的纳米显微镜技术。

Linear optics based nanoscopy.

作者信息

Gur Aviram, Fixler Dror, Micó Vicente, Garcia Javier, Zalevsky Zeev

机构信息

School of Engineering, Bar-Ilan University, 52900, Ramat-Gan, Israel.

出版信息

Opt Express. 2010 Oct 11;18(21):22222-31. doi: 10.1364/OE.18.022222.

Abstract

Classically, optical systems are considered to have a fundamental resolution limit due to wave nature of light. This article presents a novel method for observing sub-wavelength features in a conventional optical microscope using linear optics. The operation principle is based on a random and time varying flow of nanoparticles moving in proximity to the inspected sample. Those particles excite the evanescent waves and couple them into harmonic waves. The sub-wavelength features are encoded and later on digitally decoded by proper image processing of a sequence of images. The achievable final resolution limit corresponds to the size of the nanoparticles. Experimental proof of principle validation of the technique is reported.

摘要

传统上,由于光的波动性质,光学系统被认为存在一个基本的分辨率极限。本文提出了一种利用线性光学在传统光学显微镜中观察亚波长特征的新方法。其工作原理基于纳米粒子在被检查样品附近随机且随时间变化的流动。这些粒子激发倏逝波并将其耦合为谐波。亚波长特征被编码,随后通过对一系列图像进行适当的图像处理进行数字解码。可实现的最终分辨率极限对应于纳米粒子的尺寸。报道了该技术原理验证的实验证据。

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