Mansuripur M, Hsieh Y C
Appl Opt. 1994 Dec 1;33(34):8112-5. doi: 10.1364/AO.33.008112.
We describe a simple method of measuring vertical birefringence over the entire surface of an optical disk substrate.Our design consists of a linearly polarized He-Ne laser (1-2 mW) and a CCD camera interfaced to a computer. The measurement is non-intrusive, easy to set up, and needs only a few seconds to collect the data and plot a map of vertical birefringence over the surface area of the disk. The system described here is potentially useful as a qualitycontrol tool in substrate manufacturing environments.
我们描述了一种测量光盘基板整个表面垂直双折射的简单方法。我们的设计包括一台线偏振氦氖激光器（1 - 2毫瓦）和一台与计算机相连的电荷耦合器件（CCD）相机。该测量是非侵入性的，易于设置，只需几秒钟即可收集数据并绘制出光盘表面区域的垂直双折射图谱。这里描述的系统在基板制造环境中作为一种质量控制工具可能会很有用。
