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直接测量快速波长扫描激光器的瞬时线宽。

Direct measurement of the instantaneous linewidth of rapidly wavelength-swept lasers.

机构信息

Lehrstuhl für BioMolekulare Optik, Fakultät für Physik, Ludwig-Maximilians-Universität München, Oettingenstrasse 67, 80538 Munich, Germany.

出版信息

Opt Lett. 2010 Nov 15;35(22):3733-5. doi: 10.1364/OL.35.003733.

Abstract

The instantaneous linewidth of rapidly wavelength-swept laser sources as used for optical coherence tomography (OCT) is of crucial interest for a deeper understanding of physical effects involved in their operation. Swept lasers for OCT, typically sweeping over ~15 THz in ~10 μs, have linewidths of several gigahertz. The high optical-frequency sweep speed makes it impossible to measure the instantaneous spectrum with standard methods. Hence, up to now, experimental access to the instantaneous linewidth was rather indirect by the inverse Fourier transform of the coherence decay. In this Letter, we present a method by fast synchronous time gating and extraction of a "snapshot" of the instantaneous spectrum with an electro-optic modulator, which can subsequently be measured with an optical spectrum analyzer. This new method is analyzed in detail, and systematic artifacts, such as sideband generation due to the modulation and residual wavelength uncertainty due to the sweeping operation, are quantified. The method is checked for consistency with results from the common, more indirect measurement via coherence properties.

摘要

用于光学相干断层扫描(OCT)的快速波长扫描激光源的瞬时线宽对于深入了解其工作中涉及的物理效应至关重要。OCT 用的扫频激光器通常在 10μs 内扫过约 15THz,线宽为几个千兆赫。高的光频扫描速度使得用标准方法测量瞬时光谱变得不可能。因此,到目前为止,通过相干衰减的傅里叶逆变换来获得瞬时线宽的实验方法是相当间接的。在这封信中,我们提出了一种通过快速同步时间门和电光调制器提取瞬时光谱“快照”的方法,随后可以用光学频谱分析仪进行测量。详细分析了这种新方法,并量化了由于调制产生的边带和由于扫描操作产生的残余波长不确定性等系统误差。该方法通过与常见的、更间接的相干特性测量结果进行一致性检查。

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