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一种用于脑机接口的植入式集成低功耗放大器 - 微电极阵列。

An implantable integrated low-power amplifier-microelectrode array for Brain-Machine Interfaces.

作者信息

Patrick Erin, Sankar Viswanath, Rowe William, Sanchez Justin C, Nishida Toshikazu

机构信息

Department of Electrical and Computer Engineering, University of Florida, Gainesville, USA.

出版信息

Annu Int Conf IEEE Eng Med Biol Soc. 2010;2010:1816-9. doi: 10.1109/IEMBS.2010.5626419.

DOI:10.1109/IEMBS.2010.5626419
PMID:21095940
Abstract

One of the important challenges in designing Brain-Machine Interfaces (BMI) is to build implantable systems that have the ability to reliably process the activity of large ensembles of cortical neurons. In this paper, we report the design, fabrication, and testing of a polyimide-based microelectrode array integrated with a low-power amplifier as part of the Florida Wireless Integrated Recording Electrode (FWIRE) project at the University of Florida developing a fully implantable neural recording system for BMI applications. The electrode array was fabricated using planar micromachining MEMS processes and hybrid packaged with the amplifier die using a flip-chip bonding technique. The system was tested both on bench and in-vivo. Acute and chronic neural recordings were obtained from a rodent for a period of 42 days. The electrode-amplifier performance was analyzed over the chronic recording period with the observation of a noise floor of 4.5 microVrms, and an average signal-to-noise ratio of 3.8.

摘要

设计脑机接口(BMI)的重要挑战之一是构建能够可靠处理大量皮层神经元活动的可植入系统。在本文中,作为佛罗里达大学佛罗里达无线集成记录电极(FWIRE)项目的一部分,我们报告了一种集成了低功耗放大器的基于聚酰亚胺的微电极阵列的设计、制造和测试情况,该项目旨在开发一种用于BMI应用的完全可植入神经记录系统。电极阵列采用平面微加工微机电系统工艺制造,并使用倒装芯片键合技术与放大器芯片进行混合封装。该系统在实验台和体内均进行了测试。从一只啮齿动物身上获得了长达42天的急性和慢性神经记录。在慢性记录期间对电极 - 放大器性能进行了分析,观察到本底噪声为4.5微伏均方根值,平均信噪比为3.8。

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A highly compliant serpentine shaped polyimide interconnect for front-end strain relief in chronic neural implants.一种高顺应性蛇形聚酰亚胺互连,用于慢性神经植入物前端的应变缓解。
Front Neurol. 2013 Sep 12;4:124. doi: 10.3389/fneur.2013.00124. eCollection 2013.
2
Corrosion of tungsten microelectrodes used in neural recording applications.用于神经记录应用的钨微电极的腐蚀。
J Neurosci Methods. 2011 Jun 15;198(2):158-71. doi: 10.1016/j.jneumeth.2011.03.012. Epub 2011 Apr 4.