Ding L, Yu M B, Tu Xiaoguang, Lo G Q, Tripathy S, Chen T P
Institute of Microelectronics, Agency for Science, Technology and Research, 11 Science Park Road, Science Park II, 117685 Singapore.
Opt Express. 2011 Jan 31;19(3):2729-38. doi: 10.1364/OE.19.002729.
Laterally electrically-pumped Si light-emitting diodes (LEDs) based on truncated nanocrystalline-Si (nc-Si)/SiO2 quantum wells are fabricated with complementary-metal-semiconductor-oxide (CMOS) process. Visible electroluminescence (EL) can be observed under a reverse bias larger than ~6 V. The light emission would probably originate from the spontaneous hot-carrier relaxations within the conduction and the valance bands when the device is sufficiently reverse-biased. The EL spectral profile is found to be modulated by varying structure parameters of the interdigitated finger electrodes. Up to ~20 times EL intensity enhancement is achieved as compared to vertical-current-injection LED prepared using the same material system. Based on the lateral-current-injection scheme, a Si/SiO2 MQW LED with Fabry-Perot (FP) microcavity and an on-chip waveguided LED that emits at 1.55-µm are proposed.
基于截断的纳米晶硅(nc-Si)/SiO₂量子阱的横向电泵浦硅发光二极管(LED)采用互补金属半导体氧化物(CMOS)工艺制造。在大于约6 V的反向偏压下可观察到可见电致发光(EL)。当器件充分反向偏置时,发光可能源于导带和价带内的自发热载流子弛豫。发现通过改变叉指状电极的结构参数可调制EL光谱轮廓。与使用相同材料系统制备的垂直电流注入LED相比,实现了高达约20倍的EL强度增强。基于横向电流注入方案,提出了一种具有法布里-珀罗(FP)微腔的Si/SiO₂多量子阱LED和一种在1.55 µm波长发射的片上波导LED。