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用共振非弹性 X 射线散射观察声子。

Observation of phonons with resonant inelastic x-ray scattering.

机构信息

Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.

出版信息

J Phys Condens Matter. 2010 Dec 8;22(48):485601. doi: 10.1088/0953-8984/22/48/485601. Epub 2010 Nov 16.

Abstract

Phonons, the quantum mechanical representation of lattice vibrations, and their coupling to the electronic degrees of freedom are important for understanding thermal and electric properties of materials. For the first time, phonons have been measured using resonant inelastic x-ray scattering (RIXS) across the Cu K-edge in cupric oxide (CuO). Analyzing these spectra using an ultra-short core-hole lifetime approximation and exact diagonalization techniques, we can explain the essential inelastic features. The relative spectral intensities are related to the electron-phonon coupling strengths.

摘要

声子是晶格振动的量子力学表示,它们与电子自由度的耦合对于理解材料的热和电性质非常重要。首次在氧化铜(CuO)中使用共振非弹性 X 射线散射(RIXS)测量了声子。通过使用超短核心空洞寿命近似和精确对角化技术分析这些光谱,我们可以解释基本的非弹性特征。相对光谱强度与电子-声子耦合强度有关。

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