Yang Zu-Po, Hsieh Mei-Li, Bur James A, Ci Lijie, Hanssen Leonard M, Wilthan Boris, Ajayan Pulickel M, Lin Shawn-Yu
Future Chips Constellation and Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, New York 12180, USA.
Appl Opt. 2011 May 1;50(13):1850-5. doi: 10.1364/AO.50.001850.
We experimentally demonstrate a nearly wavelength-independent optical reflection from an extremely rough carbon nanotube sample. The sample is made of a vertically aligned nanotube array, is a super dark material, and exhibits a near-perfect blackbody emission at T=450 K-600 K. No other material exhibits such optical properties, i.e., ultralow reflectance accompanied by a lack of wavelength scaling behavior. This observation is a result of the lowest ever measured reflectance (R=0.0003) of the sample over a broad infrared wavelength of 3 μm < λ < 13 μm. This discovery may be attributed to the unique interlocking surface of the nanotube array, consisting of both a global, large scale and a short-range randomness.
我们通过实验证明了来自极其粗糙的碳纳米管样品的几乎与波长无关的光反射。该样品由垂直排列的纳米管阵列制成,是一种超暗材料,并且在T = 450 K - 600 K时表现出近乎完美的黑体发射。没有其他材料具有这样的光学特性,即超低反射率且缺乏波长缩放行为。这一观察结果是由于该样品在3μm < λ < 13μm的宽红外波长范围内测得的有史以来最低反射率(R = 0.0003)。这一发现可能归因于纳米管阵列独特的互锁表面,它兼具全局的、大规模的和短程的随机性。