Institute of Physics, Academia Sinica, Taipei, Taiwan, 11529, Republic of China.
Nanoscale Res Lett. 2011 Jul 23;6(1):468. doi: 10.1186/1556-276X-6-468.
Nanocrystalline Co40Fe40B20 films, with film thickness tf = 100 nm, were deposited on glass substrates by the magnetron sputtering method at room temperature. During the film deposition period, a dc magnetic field, h = 40 Oe, was applied to introduce an easy axis for each film sample: one with h||L and the other with h||w, where L and w are the length and width of the film. Ferromagnetic resonance (FMR), ultrahigh frequency impedance (IM), dc electrical resistivity (ρ), and magnetic hysteresis loops (MHL) of these films were studied. From the MHL and r measurements, we obtain saturation magnetization 4πMs = 15.5 kG, anisotropy field Hk = 0.031 kG, and r = 168 mW.cm. From FMR, we can determine the Kittel mode ferromagnetic resonance (FMR-K) frequency fFMRK = 1,963 MHz. In the h||L case, IM spectra show the quasi-Kittel-mode ferromagnetic resonance (QFMR-K) at f0 and the Walker-mode ferromagnetic resonance (FMR-W) at fn, where n = 1, 2, 3, and 4. In the h||w case, IM spectra show QFMR-K at F0 and FMR-W at Fn. We find that f0 and F0 are shifted from fFMRK, respectively, and fn = Fn. The in-plane spin-wave resonances are responsible for those relative shifts.PACS No. 76.50.+q; 84.37.+q; 75.70.-i.
纳米晶 Co40Fe40B20 薄膜，厚度 tf = 100nm，采用磁控溅射方法在室温下沉积在玻璃衬底上。在薄膜沉积过程中，施加直流磁场 h = 40Oe，为每个薄膜样品引入易轴：一个 h||L，另一个 h||w，其中 L 和 w 分别是薄膜的长度和宽度。研究了这些薄膜的铁磁共振（FMR）、超高频阻抗（IM）、直流电阻率（ρ）和磁滞回线（MHL）。从 MHL 和 r 的测量中，我们得到饱和磁化强度 4πMs = 15.5kG、各向异性场 Hk = 0.031kG 和 r = 168mW.cm。从 FMR 中，我们可以确定 Kittel 模式铁磁共振（FMR-K）频率 fFMRK = 1.963MHz。在 h||L 的情况下，IM 谱在 f0 处显示准 Kittel 模式铁磁共振（QFMR-K），在 fn 处显示 Walker 模式铁磁共振（FMR-W），其中 n = 1、2、3 和 4。在 h||w 的情况下，IM 谱在 F0 处显示 QFMR-K，在 Fn 处显示 FMR-W。我们发现 f0 和 F0 分别从 fFMRK 偏移，并且 fn = Fn。面内自旋波共振是这些相对偏移的原因。
PACS 编号：76.50.+q；84.37.+q；75.70.-i。
