Johnson W Ben, Braly Alan, Cobian Kenneth, Craig Mary B, Voegtlin Loline, Haddad Tarek, McVenes Rick
Iowa Heart Center, PC, Des Moines, Iowa 50134, USA.
Pacing Clin Electrophysiol. 2012 Jan;35(1):51-7. doi: 10.1111/j.1540-8159.2011.03230.x. Epub 2011 Oct 5.
There has been concern over declining bipolar (BP) impedance (Z) in aging polyurethane (PU) cardiac pacing leads. Subsequently, a prospective study was conducted comparing BP Z, threshold (Th), and R-wave sensing amplitude of 55D PU-insulated (Model 4024, Medtronic, Inc., Minneapolis, MN, USA) and silicone-insulated (Model 5024) leads.
This study was initiated by The Iowa Heart Center. Patients with Model 4024 (N = 162) or 5024 (N = 120) pacing leads with at least 6 years implant time were enrolled and followed for an additional 5 years.
There was a significant drop in the mean BP Z for the Model 4024 population, between enrollment (6 years) and the final endpoint (11 years), which was in contrast to the Model 5024 which did not see a significant drop in its mean BP Z for this same period. The trend difference seen in the means between the two models was statistically significant (P < 0.0001). In addition, a statistically significant relationship was found between dropping BP Z and rising Th (P < 0.0001). The analysis showed that if BP Z dropped below 200 ohms, the probability of having a >3X increase over baseline, in Th at 2.5 V, increases from approximately 3-7% to as high as 30%.
A significant drop in BP Z observed in the PU-insulated Model 4024 lead was not present in the silicone-insulated Model 5024 lead. The statistically significant relationship between dropping BP Z and rising Th helps to understand how to better manage patients with aging leads.
人们一直担心老化的聚氨酯(PU)心脏起搏导线的双极(BP)阻抗(Z)会下降。随后,进行了一项前瞻性研究,比较了55D PU绝缘(型号4024,美敦力公司,明尼阿波利斯,明尼苏达州,美国)和硅胶绝缘(型号5024)导线的BP Z、阈值(Th)和R波感知幅度。
本研究由爱荷华心脏中心发起。纳入植入时间至少6年的型号4024(N = 162)或5024(N = 120)起搏导线的患者,并再随访5年。
型号4024组人群在入组时(6年)至最终终点(11年)期间,平均BP Z显著下降,这与型号5024组在同一时期平均BP Z未显著下降形成对比。两种型号之间均值的趋势差异具有统计学意义(P < 0.0001)。此外,发现BP Z下降与Th升高之间存在统计学显著关系(P < 0.0001)。分析表明,如果BP Z降至200欧姆以下,在2.5 V时Th比基线增加>3倍的概率从约3 - 7%增加到高达30%。
在PU绝缘的型号4024导线中观察到的BP Z显著下降在硅胶绝缘的型号5024导线中未出现。BP Z下降与Th升高之间的统计学显著关系有助于理解如何更好地管理使用老化导线的患者。