Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439, USA.
J Synchrotron Radiat. 2011 Nov;18(Pt 6):899-906. doi: 10.1107/S0909049511036703. Epub 2011 Sep 14.
The development of medium-energy inelastic X-ray scattering optics with meV and sub-meV resolution has attracted considerable efforts in recent years. Meanwhile, there are also concerns or debates about the fundamental and feasibility of the involved schemes. Here the central optical component, the back-reflection angular-dispersion monochromator or analyzer, is analyzed. The results show that the multiple-beam diffraction effect together with transmission-induced absorption can noticeably reduce the diffraction efficiency, although it may not be a fatal threat. In order to improve the efficiency, a simple four-bounce analyzer is proposed that completely avoids these two adverse effects. The new scheme is illustrated to be a feasible alternative approach for developing meV- to sub-meV-resolution inelastic X-ray scattering spectroscopy.
近年来，具有毫电子伏特和亚毫电子伏特分辨率的中能非弹性 X 射线散射光学的发展引起了相当大的关注。同时，对于所涉及方案的基本原理和可行性也存在一些关注或争议。本文分析了中心光学元件，背反射角分散单色仪或分析仪。结果表明，虽然多光束衍射效应以及透射诱导吸收可能会显著降低衍射效率，但这可能不是一个致命的威胁。为了提高效率，提出了一种简单的四反射分析仪，该分析仪完全避免了这两种不利影响。该新方案被证明是开发毫电子伏特到亚毫电子伏特分辨率非弹性 X 射线散射光谱学的一种可行的替代方法。
