Electrical Engineering Institute and Interdisciplinary Center for Electron Microscopy (CIME), Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland.
Nano Lett. 2011 Dec 14;11(12):5148-53. doi: 10.1021/nl2022288. Epub 2011 Oct 26.
Single-layer molybdenum disulfide (MoS2) is a newly emerging two-dimensional semiconductor with a potentially wide range of applications in the fields of nanoelectronics and energy harvesting. The fact that it can be exfoliated down to single-layer thickness makes MoS2 interesting both for practical applications and for fundamental research, where the structure and crystalline order of ultrathin MoS2 will have a strong influence on electronic, mechanical, and other properties. Here, we report on the transmission electron microscopy study of suspended single- and few-layer MoS2 membranes with thicknesses previously determined using both optical identification and atomic force microscopy. Electron microscopy shows that monolayer MoS2 displays long-range crystalline order, although surface roughening has been observed with ripples which can reach 1 nm in height, just as in the case of graphene, implying that similar mechanisms are responsible for the stability of both two-dimensional materials. The observed ripples could explain the degradation of mobility in MoS2 due to exfoliation. We also find that symmetry breaking due to the reduction of the number of layers results in distinctive features in electron-beam diffraction patterns of single- and multilayer MoS2, which could be used as a method for identifying single layers using only electron microscopy. The isolation of suspended single-layer MoS2 membranes will improve our understanding of two-dimensional systems, their stability, and the interplay between their structures, morphologies, and electrical and mechanical properties.
单层二硫化钼 (MoS2) 是一种新兴的二维半导体,在纳米电子学和能量收集等领域具有广泛的应用潜力。由于其可以剥离至单层厚度,因此无论是在实际应用还是在基础研究中,MoS2 都非常有趣,在基础研究中,超薄 MoS2 的结构和晶体有序性将对电子、机械和其他性能产生强烈影响。在这里,我们报告了使用光学识别和原子力显微镜先前确定的厚度的悬浮式单层和少数层 MoS2 膜的透射电子显微镜研究。电子显微镜表明,单层 MoS2 具有长程晶体有序性,尽管已经观察到表面粗糙度呈波纹状,高度可达 1nm,就像石墨烯一样,这意味着两种二维材料的稳定性都与类似的机制有关。观察到的波纹可以解释由于剥离导致的 MoS2 迁移率下降。我们还发现,由于层数的减少导致的对称破缺导致了单层和多层 MoS2 的电子束衍射图案中的独特特征,这可以用作仅使用电子显微镜识别单层的方法。悬浮单层 MoS2 膜的隔离将提高我们对二维系统及其稳定性的理解,以及它们的结构、形态以及电和机械性能之间的相互作用。