Department of Chemistry, Indian Institute of Science Education and Research, Bhopal 462023, India.
J Phys Chem A. 2012 Oct 11;116(40):9791-801. doi: 10.1021/jp306169f. Epub 2012 Sep 7.
The development of charge density analysis has undergone a major renaissance in the last two decades. In recent years, the characterization of bonding features associated with atoms in molecules and in crystals has been explored using high-resolution X-ray diffraction data (laboratory or synchrotron) complemented by high level ab initio theoretical calculations. The extraction of one electron topological properties, namely, electrostatic charges, dipole moment and higher moments, electrostatic potential, electric field gradients, in addition to evaluation of the local kinetic and potential energy densities, have contributed toward an understanding of the electron density distributions in molecular solids. New topological descriptors, namely, the source function (SF) and electron localization function (ELF) provide additional information as regards characterization of the topology of the electron density. In addition, delocalization indices have also been developed to account for bonding features pertinent to M-M bonds. The evaluation of these properties have contributed significantly toward the understanding of intra- and intermolecular bonding features in organic, inorganic, and biomolecules in the crystalline phase, with concomitant applications in the understanding of chemical reactivity and material/biological properties. In recent years, the focus has strongly shifted toward the understanding of structure-property relationships in organometallic complexes containing labile M-C bonds in the crystal structure with subsequent implications in catalysis. This perspective aims to highlight the major developments in electron density measurements in the past few years and provides pointers directed toward the potential use of this technique in future applications for an improved understanding of chemical bonding in systems that have been unexplored.
电荷密度分析在过去二十年中经历了重大复兴。近年来,使用高分辨率 X 射线衍射数据(实验室或同步加速器)补充高水平的从头算理论计算,探索了与分子和晶体中原子相关的键合特征的描述。提取单电子拓扑性质,即静电电荷、偶极矩和更高阶矩、静电势、电场梯度,以及评估局部动能和势能密度,有助于理解分子固体中的电子密度分布。新的拓扑描述符,即源函数 (SF) 和电子定域函数 (ELF),提供了有关电子密度拓扑特征描述的额外信息。此外,离域指数也已被开发出来,以说明与 M-M 键相关的键合特征。这些性质的评估对理解有机、无机和生物分子在晶体相中的分子内和分子间键合特征做出了重大贡献,同时也有助于理解化学反应性和材料/生物性质。近年来,研究重点强烈转向理解晶体结构中含有不稳定 M-C 键的金属有机配合物中的结构-性质关系,随后对催化产生了影响。本观点旨在强调过去几年中电子密度测量的主要发展,并指出该技术在未来应用中的潜在用途,以提高对尚未探索的系统中化学键的理解。