Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology, Central 2, Umezono, Tsukuba, Ibaraki, Japan.
PLoS One. 2012;7(10):e46904. doi: 10.1371/journal.pone.0046904. Epub 2012 Oct 8.
Scanning electron microscopy (SEM) is an important tool for the nanometre-scale analysis of the various samples. Imaging of biological specimens can be difficult for two reasons: (1) Samples must often be left unstained to observe detail of the biological structures; however, lack of staining significantly decreases image contrast. (2) Samples are prone to serious radiation damage from electron beam. Herein we report a novel method for sample preparation involving placement on a new metal-coated insulator film. This method enables obtaining high-contrast images from unstained proteins and viruses by scanning electron microscopy with minimal electron radiation damage. These images are similar to those obtained by transmission electron microscopy. In addition, the method can be easily used to observe specimens of proteins, viruses and other organic samples by using SEM.
扫描电子显微镜(SEM)是分析各种样本的纳米级结构的重要工具。由于以下两个原因,对生物样本进行成像较为困难:(1)为了观察生物结构的细节,样本通常不能进行染色;然而,不染色会显著降低图像的对比度。(2)样本容易受到电子束的严重辐射损伤。本文报告了一种新的样本制备方法,涉及放置在新的金属涂层绝缘体薄膜上。该方法能够通过扫描电子显微镜获得最小电子辐射损伤的未染色蛋白质和病毒的高对比度图像。这些图像与透射电子显微镜获得的图像相似。此外,该方法可以很容易地用于通过 SEM 观察蛋白质、病毒和其他有机样本的标本。