Tanaka Nobuo, Usukura Jiro, Kusunoki Michiko, Saito Yahachi, Sasaki Katuhiro, Tanji Takayoshi, Muto Shunsuke, Arai Shigeo
Ecotopia Science Institute and Graduate School of Engineering, Nagoya University, Chikusa-ku, Nagoya, Japan.
Microscopy (Oxf). 2013 Feb;62(1):205-15. doi: 10.1093/jmicro/dfs095. Epub 2013 Jan 16.
Environmental transmission electron microscopy and ultra-high resolution electron microscopic observation using aberration correctors have recently emerged as topics of great interest. The former method is an extension of the so-called in situ electron microscopy that has been performed since the 1970s. Current research in this area has been focusing on dynamic observation with atomic resolution under gaseous atmospheres and in liquids. Since 2007, Nagoya University has been developing a new 1-MV high voltage (scanning) transmission electron microscope that can be used to observe nanomaterials under conditions that include the presence of gases, liquids and illuminating lights, and it can be also used to perform mechanical operations to nanometre-sized areas as well as electron tomography and elemental analysis by electron energy loss spectroscopy. The new instrument has been used to image and analyse various types of samples including biological ones.
环境透射电子显微镜以及使用像差校正器的超高分辨率电子显微镜观察，近来已成为备受关注的课题。前一种方法是自20世纪70年代以来就已开展的所谓原位电子显微镜的扩展。该领域当前的研究一直聚焦于在气态氛围和液体中以原子分辨率进行动态观察。自2007年以来，名古屋大学一直在研发一种新型的1兆伏高电压（扫描）透射电子显微镜，它可用于在包含气体、液体和照明光的条件下观察纳米材料，还可用于对纳米尺寸区域进行机械操作以及通过电子能量损失谱进行电子断层扫描和元素分析。这台新仪器已用于对包括生物样本在内的各类样本进行成像和分析。
