Department of Physics, University of Houston, Houston 77204, USA.
Opt Lett. 2013 May 1;38(9):1461-3. doi: 10.1364/OL.38.001461.
In this Letter, we present a single-step method to simultaneously retrieve x-ray absorption and phase images valid for a broad range of imaging energies and material properties. Our method relies on the availability of spectrally resolved intensity measurements, which is now possible using semiconductor x-ray photon counting detectors. The retrieval method is derived and presented, with results showing good agreement.
在这封信件中，我们提出了一种单步方法，可以同时获取适用于广泛成像能量和材料特性的 X 射线吸收和相位图像。我们的方法依赖于光谱分辨强度测量的可用性，这现在使用半导体 X 射线光子计数探测器成为可能。我们推导并呈现了检索方法，结果显示出良好的一致性。
