磁性精细结构的小角电子散射

Small-angle electron scattering of magnetic fine structures.

作者信息

Togawa Yoshihiko

机构信息

Nanoscience and Nanotechnology Research Center (N2RC), Research Institutes for the Twenty First Century, Osaka Prefecture University, Gakuencho 1-2, Naka-ku, Sakai, Osaka 599-8570, Japan.

出版信息

Microscopy (Oxf). 2013 Jun;62 Suppl 1:S75-86. doi: 10.1093/jmicro/dft007. Epub 2013 May 13.

DOI:10.1093/jmicro/dft007

PMID:23674342

Abstract

Magnetic structures in magnetic artificial lattices and chiral magnetic orders in chiral magnets have been quantitatively analyzed in the reciprocal space by means of small-angle electron scattering (SAES) method. Lorentz deflection due to magnetic moments and Bragg diffraction due to periodicity are simultaneously recorded at an angle of the order of or less than 1 × 10(-6) rad, using a camera length of more than 100 m. The present SAES method, together with TEM real-space imaging methods such as in-situ Lorentz microscopy, is very powerful in analyzing magnetic fine structures in magnetic materials. Indeed, the existence of both a chiral helimagnetic structure and a chiral magnetic soliton lattice in a chiral magnet CrNb3S6 has been successfully verified for the first time using the present complementary methods.

摘要

通过小角电子散射（SAES）方法，已在倒易空间中对磁性人工晶格中的磁性结构和手性磁体中的手性磁序进行了定量分析。利用磁矩产生的洛伦兹偏转和周期性产生的布拉格衍射，在相机长度超过100米的情况下，以1×10⁻⁶弧度或更小的角度同时进行记录。目前的SAES方法与诸如原位洛伦兹显微镜等透射电子显微镜实空间成像方法相结合，在分析磁性材料中的磁性精细结构方面非常强大。事实上，首次使用目前的互补方法成功验证了手性磁体CrNb₃S₆中同时存在手性螺旋磁结构和手性磁孤子晶格。