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纳米压印光刻图形化 GaAs 坑中生长的单个 InAs 量子点的尺寸依赖性性质。

Size-dependent properties of single InAs quantum dots grown in nanoimprint lithography patterned GaAs pits.

机构信息

Optoelectronics Research Centre, Tampere University of Technology, PO Box 692, FIN-33101, Tampere, Finland.

出版信息

Nanotechnology. 2013 Jun 14;24(23):235204. doi: 10.1088/0957-4484/24/23/235204. Epub 2013 May 15.

Abstract

We report on the structural and optical properties of single InAs quantum dots (QDs) formed in etched GaAs pits with different dimensions. The site-controlled QDs were fabricated by molecular beam epitaxy on GaAs(001) surfaces patterned by nanoimprint lithography. We show that the properties of the QDs can be modified by varying the dimensions of the etched GaAs pits. Increasing the pit size resulted in larger QDs and thus in longer photoluminescence wavelengths. However, the fine structure splitting remained unaffected. A photoluminescence linewidth of 41 μeV and average fine structure splitting of 15.7 μeV were obtained for exciton recombination in the single site-controlled QDs.

摘要

我们报告了在具有不同尺寸的刻蚀 GaAs 凹坑中形成的单个 InAs 量子点 (QD) 的结构和光学性质。通过在 GaAs(001) 表面上进行纳米压印光刻图案化的分子束外延,制备了局域量子点。我们表明,通过改变刻蚀 GaAs 凹坑的尺寸可以改变 QD 的性质。增加凹坑尺寸会导致更大的 QD,从而导致更长的光致发光波长。然而,精细结构分裂仍然不受影响。在单局域量子点中的激子复合中,获得了 41 μeV 的光致发光线宽和 15.7 μeV 的平均精细结构分裂。

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