He Jun, Yadavalli Kameshwar, Zhao Zuoming, Li Ning, Hao Zhibiao, Wang Kang L, Jacob Ajey P
Device Research Laboratory, Electrical Engineering, University of California, Los Angeles, CA 90095, USA.
Nanotechnology. 2008 Nov 12;19(45):455607. doi: 10.1088/0957-4484/19/45/455607. Epub 2008 Oct 9.
The potential benefit from the combination of the optoelectronic and electronic functionality of III-V semiconductors with silicon technology is one of the most desired outcomes to date. Here we have systematically investigated the optical properties of InAs quantum structure embedded in GaAs grown on patterned sub-micron and nanosize holes on Si(001). III-V material tends to accumulate in the patterned sub-micron holes and a material depletion region is observed around holes when GaAs/InAs/GaAs is deposited directly on patterned Si(001). By use of a 60 nm SiO(2) layer and patterning sub-micron and nanosize holes through the oxide layer to the substrate, we demonstrate that high optical quality InAs nanostructures, both quantum dots and quantum wells, formed by a two-monolayer InAs layer embedded in GaAs can be epitaxially grown on Si(001). We also report the power-dependent and temperature-dependent photoluminescence spectra of these structures. The results show that hole diameter (sub-micron versus nanosize) has a strong effect on the structural and optical properties of GaAs/InAs/GaAs nanostructures.
将III-V族半导体的光电功能与硅技术相结合所带来的潜在益处,是迄今为止最令人期待的成果之一。在此,我们系统地研究了嵌入在生长于Si(001)上的具有图案化亚微米和纳米尺寸孔洞的GaAs中的InAs量子结构的光学性质。当直接在图案化的Si(001)上沉积GaAs/InAs/GaAs时,III-V族材料倾向于在图案化的亚微米孔洞中聚集,并且在孔洞周围观察到材料耗尽区。通过使用60纳米厚的SiO₂层,并通过该氧化层对衬底进行图案化亚微米和纳米尺寸的孔洞,我们证明了由嵌入GaAs中的两层InAs形成的高质量InAs纳米结构(量子点和量子阱)可以在Si(001)上外延生长。我们还报告了这些结构的功率依赖和温度依赖的光致发光光谱。结果表明,孔洞直径(亚微米与纳米尺寸)对GaAs/InAs/GaAs纳米结构的结构和光学性质有强烈影响。