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MutMap-Gap:突变 F2 后代群体的全基因组重测序与缺口区域的从头组装相结合,鉴定出稻瘟病抗性基因 Pii。

MutMap-Gap: whole-genome resequencing of mutant F2 progeny bulk combined with de novo assembly of gap regions identifies the rice blast resistance gene Pii.

机构信息

Iwate Biotechnology Research Center, Kitakami, Iwate, 024-0003, Japan.

United Graduate School of Iwate University, Morioka, Iwate, 020-8550, Japan.

出版信息

New Phytol. 2013 Oct;200(1):276-283. doi: 10.1111/nph.12369. Epub 2013 Jun 24.

Abstract

Next-generation sequencing allows the identification of mutations responsible for mutant phenotypes by whole-genome resequencing and alignment to a reference genome. However, when the resequenced cultivar/line displays significant structural variation from the reference genome, mutations in the genome regions missing from the reference (gaps) cannot be identified by simple alignment. Here we report on a method called 'MutMap-Gap', which involves delineating a candidate region harboring a mutation of interest using the recently reported MutMap method, followed by de novo assembly, alignment, and identification of the mutation within genome gaps. We applied MutMap-Gap to isolate the blast resistant gene Pii from the rice cv Hitomebore using mutant lines that have lost Pii function. MutMap-Gap should prove useful for cloning genes that exhibit significant structural variations such as disease resistance genes of the nucleotide-binding site-leucine rich repeat (NBS-LRR) class.

摘要

下一代测序通过全基因组重测序和与参考基因组比对,可以鉴定导致突变表型的突变。然而,当重测序的品种/系与参考基因组显示出显著的结构变异时,参考基因组缺失区域(缺口)中的突变不能通过简单的比对来识别。在这里,我们报告了一种名为“MutMap-Gap”的方法,该方法涉及使用最近报道的 MutMap 方法来描绘包含感兴趣突变的候选区域,然后进行从头组装、比对,并在基因组缺口内鉴定突变。我们应用 MutMap-Gap 从失去 Pii 功能的突变系中分离出水稻品种 Hitomebore 的抗稻瘟病基因 Pii。MutMap-Gap 应该对克隆具有显著结构变异的基因(如核苷酸结合位点富含亮氨酸重复(NBS-LRR)类的抗病基因)非常有用。

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