Mahdan Mohd Haidil Akmal, Nakajima Masatoshi, Foxton Richard M, Tagami Junji
Cariology and Operative Dentistry, Department of Restorative Sciences, Graduate School of Medical and Dental Sciences, Tokyo Medical and Dental University, 1-5-45 Yushima Bunkyo ku, Tokyo 113-8549, Japan; Global Centre of Excellence Programme, International Research Center for Molecular and Bone Diseases at Tokyo Medical and Dental University, 1-5-45 Yushima Bunkyo ku, 113-8549, Japan.
J Dent. 2013 Oct;41(10):861-71. doi: 10.1016/j.jdent.2013.07.002. Epub 2013 Jul 11.
This study evaluated the combined effect of smear layer characteristics with hydrostatic pulpal pressure (PP) on bond strength and nanoleakage expression of HEMA-free and -containing self-etch adhesives.
Flat dentine surfaces were obtained from extracted human molars. Smear layers were created by grinding with #180- or #600-SiC paper. Three HEMA-free adhesives (Xeno V, G Bond Plus, Beautibond Multi) and two HEMA-containing adhesives (Bond Force, Tri-S Bond) were applied to the dentine surfaces under hydrostatic PP or none. Dentine bond strengths were determined using the microtensile bond test (μTBS). Data were statistically analyzed using three- and two-way ANOVA with Tukey post hoc comparison test. Nanoleakage evaluation was carried out under a scanning electron microscope (SEM).
Coarse smear layer preparation and hydrostatic PP negatively affected the μTBS of HEMA-free and -containing adhesives, but there were no significant differences. The combined experimental condition significantly reduced μTBS of the HEMA-free adhesives, while the HEMA-containing adhesives exhibited no significant differences. Two-way ANOVA indicated that for HEMA-free adhesives, there were significant interactions in μTBS between smear layer characteristics and pulpal pressure, while for HEMA-containing adhesives, there were no significant interactions between them. Nanoleakage formation within the adhesive layers of both adhesive systems distinctly increased in the combined experimental group.
The combined effect of coarse smear layer preparation with hydrostatic PP significantly reduced the μTBS of HEMA-free adhesives, while in HEMA-containing adhesives, these effects were not obvious.
Smear layer characteristics and hydrostatic PP would additively compromise dentine bonding of self-etch adhesives, especially HEMA-free adhesives.
本研究评估了玷污层特性与静水压牙髓压力(PP)对不含甲基丙烯酸羟乙酯(HEMA)和含HEMA的自酸蚀粘结剂的粘结强度及纳米渗漏表现的联合影响。
从拔除的人磨牙获取平坦的牙本质表面。用#180或#600碳化硅砂纸打磨形成玷污层。在有或无静水压PP的情况下,将三种不含HEMA的粘结剂(Xeno V、G Bond Plus、Beautibond Multi)和两种含HEMA的粘结剂(Bond Force、Tri-S Bond)应用于牙本质表面。使用微拉伸粘结试验(μTBS)测定牙本质粘结强度。数据采用三因素和两因素方差分析及Tukey事后比较检验进行统计学分析。在扫描电子显微镜(SEM)下进行纳米渗漏评估。
粗糙玷污层制备和静水压PP对不含HEMA和含HEMA的粘结剂的μTBS有负面影响,但无显著差异。联合实验条件显著降低了不含HEMA粘结剂的μTBS,而含HEMA的粘结剂无显著差异。两因素方差分析表明,对于不含HEMA的粘结剂,玷污层特性与牙髓压力之间在μTBS方面存在显著交互作用,而对于含HEMA的粘结剂,它们之间无显著交互作用。在联合实验组中,两种粘结系统的粘结剂层内纳米渗漏形成明显增加。
粗糙玷污层制备与静水压PP的联合作用显著降低了不含HEMA粘结剂的μTBS,而在含HEMA的粘结剂中,这些影响不明显。
玷污层特性和静水压PP会叠加损害自酸蚀粘结剂的牙本质粘结,尤其是不含HEMA的粘结剂。