IEEE Trans Biomed Circuits Syst. 2008 Sep;2(3):164-72. doi: 10.1109/TBCAS.2008.2001473.
Measurement of the cumulative loading statistics experienced by an implant is essential for prediction of long-term fatigue failure. However, the total power that can be harvested using typical in-vivo strain levels is less than 1 muW. In this paper, we present a novel method for long-term, battery-less fatigue monitoring by integrating piezoelectric transduction with hot-electron injection on a floating-gate transistor array. Measured results from a fabricated prototype in a 0.5-mum CMOS process demonstrate that the array can sense, compute, and store loading statistics for over 70000 stress-strain cycles which can be extended to beyond 107 cycles. The measured response also shows excellent agreement with a theoretical model and the nominal power dissipation of the array has been measured to be less than 800 nW.
测量植入物所经历的累积加载统计数据对于预测长期疲劳失效至关重要。然而,使用典型的体内应变水平可以采集到的总功率小于 1 微瓦。在本文中,我们提出了一种通过将压电转换与浮栅晶体管阵列上的热电子注入相结合来进行长期、无电池疲劳监测的新方法。在 0.5 微米 CMOS 工艺中制造的原型的测量结果表明,该阵列可以感应、计算和存储超过 70000 次应力-应变循环的加载统计信息,并且可以扩展到超过 107 次循环。测量结果还与理论模型非常吻合,并且已经测量出该阵列的标称功耗小于 800 纳瓦。