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基于从头算辅助的电流作用下 Sn-Pb 二元系 CALPHAD 热力学模型。

Ab initio-aided CALPHAD thermodynamic modeling of the Sn-Pb binary system under current stressing.

机构信息

1] Department of Materials Science and Engineering, National Cheng Kung University, Tainan city 70101, TAIWAN [2] Promotion Center for Global Materials Research, National Cheng Kung University, Tainan city 70101, TAIWAN [3] Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan city 70101, TAIWAN.

出版信息

Sci Rep. 2013;3:2731. doi: 10.1038/srep02731.

DOI:10.1038/srep02731
PMID:24060995
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC3781394/
Abstract

Soldering is an ancient process, having been developed 5000 years ago. It remains a crucial process with many modern applications. In electronic devices, electric currents pass through solder joints. A new physical phenomenon--the supersaturation of solders under high electric currents--has recently been observed. It involves (1) un-expected supersaturation of the solder matrix phase, and (2) the formation of unusual "ring-shaped" grains. However, the origin of these phenomena is not yet understood. Here we provide a plausible explanation of these phenomena based on the changes in the phase stability of Pb-Sn solders. Ab initio-aided CALPHAD modeling is utilized to translate the electric current-induced effect into the excess Gibbs free energies of the phases. Hence, the phase equilibrium can be shifted by current stressing. The Pb-Sn phase diagrams with and without current stressing clearly demonstrate the change in the phase stabilities of Pb-Sn solders under current stressing.

摘要

焊接是一种古老的工艺,已有 5000 年的历史。它仍然是一个关键的工艺,有许多现代的应用。在电子设备中,电流通过焊点。最近观察到一种新的物理现象——在高电流下焊料的过饱和。它涉及(1)焊料基体相的意外过饱和,和(2)形成不寻常的“环形”晶粒。然而,这些现象的起源尚不清楚。在这里,我们根据 Pb-Sn 焊料的相稳定性变化,对这些现象提供了一个合理的解释。基于第一性原理的 CALPHAD 建模被用来将电流引起的效应转化为各相的过剩吉布斯自由能。因此,相平衡可以通过电流应力来改变。有和没有电流应力的 Pb-Sn 相图清楚地表明了电流应力下 Pb-Sn 焊料的相稳定性的变化。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9688/3781394/c3a6af65b3e3/srep02731-f4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9688/3781394/b9f169152394/srep02731-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9688/3781394/e5297090ec97/srep02731-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9688/3781394/80fddf4253e2/srep02731-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9688/3781394/c3a6af65b3e3/srep02731-f4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9688/3781394/b9f169152394/srep02731-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9688/3781394/e5297090ec97/srep02731-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9688/3781394/80fddf4253e2/srep02731-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9688/3781394/c3a6af65b3e3/srep02731-f4.jpg

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