Institute for Measurement Systems and Sensor Technology, Technische Universität München, Theresienstrasse 90/N5, Munich 80333, Germany.
Sensors (Basel). 2013 Sep 23;13(9):12687-97. doi: 10.3390/s130912687.
This paper presents a low-cost hyperspectral measurement setup in a new application based on fluorescence detection in the visible (Vis) wavelength range. The aim of the setup is to take hyperspectral fluorescence images of viscous materials. Based on these images, fluorescent and non-fluorescent impurities in the viscous materials can be detected. For the illumination of the measurement object, a narrow-band high-power light-emitting diode (LED) with a center wavelength of 370 nm was used. The low-cost acquisition unit for the imaging consists of a linear variable filter (LVF) and a complementary metal oxide semiconductor (CMOS) 2D sensor array. The translucent wavelength range of the LVF is from 400 nm to 700 nm. For the confirmation of the concept, static measurements of fluorescent viscous materials with a non-fluorescent impurity have been performed and analyzed. With the presented setup, measurement surfaces in the micrometer range can be provided. The measureable minimum particle size of the impurities is in the nanometer range. The recording rate for the measurements depends on the exposure time of the used CMOS 2D sensor array and has been found to be in the microsecond range.
本文提出了一种基于可见（Vis）波长荧光检测的新型低成本高光谱测量设置，用于粘性材料的高光谱荧光成像。该设置的目的是获取粘性材料的高光谱荧光图像，基于这些图像，可以检测粘性材料中的荧光和非荧光杂质。为了照明测量对象，使用了中心波长为 370nm 的窄带高功率发光二极管（LED）。低成本成像采集单元由线性可变滤波器（LVF）和互补金属氧化物半导体（CMOS）2D 传感器阵列组成。LVF 的半透明波长范围为 400nm 至 700nm。为了验证该概念，已经对具有非荧光杂质的荧光粘性材料进行了静态测量和分析。使用所提出的设置，可以提供亚微米级的测量表面。可测量的杂质最小粒径在纳米范围内。测量的记录率取决于所使用的 CMOS 2D 传感器阵列的曝光时间，发现其范围在微秒级。
