Grupo de Fı́sica-Matemática da Universidade de Lisboa , Av. Prof. Gama Pinto 2, 1649-003 Lisboa, Portugal.
J Phys Chem B. 2013 Dec 19;117(50):16188-95. doi: 10.1021/jp407768u. Epub 2013 Dec 5.
We study the temperature dependence of the lifetime of geometric and geometric/energetic water hydrogen-bonds (H-bonds), down to supercooled water, through molecular dynamics. The probability and lifetime of H-bonds that break either by translational or librational motions and those of energetic broken H-bonds, along with the effects of transient broken H-bonds and transient H-bonds, are considered. We show that the fraction of transiently broken energetic H-bonds increases at low temperatures and that this energetic breakdown is caused by oxygen-oxygen electrostatic repulsions upon too small amplitude librations to disrupt geometric H-bonds. Hence, differences between geometric and energetic continuous H-bond lifetimes are associated with large H-bond energy fluctuations, in opposition to moderate geometric fluctuations, within common energetic and geometric H-bond definition thresholds. Exclusion of transient broken H-bonds and transient H-bonds leads to H-bond definition-independent mean lifetimes and activation energies, 11 kJ/mol, consistent with the reactive flux method and experimental scattering results. Further, we show that power law decay of specific temporal H-bond lifetime probability distributions is associated with librational and translational motions that occur on the time scale (0.1 ps) of H-bond breaking /re-forming dynamics. While our analysis is diffusion-free, the effect of diffusion on H-bond probability distributions where H-bonds are allowed to break and re-form, switching acceptors in between, is shown to result in neither exponential nor power law decay, similar to the reactive flux correlation function.
我们通过分子动力学研究了几何和几何/能量氢键(H 键)的寿命随温度的变化,直至过冷水。我们考虑了通过平移或旋转运动断裂的 H 键的概率和寿命,以及断裂的能量 H 键的概率和寿命,以及瞬态断裂的 H 键和瞬态 H 键的影响。我们表明,在低温下,瞬态断裂的能量 H 键的比例增加,这种能量断裂是由于过小的振幅旋转引起的氧-氧静电排斥,从而破坏了几何 H 键。因此,几何和能量连续 H 键寿命之间的差异与大的 H 键能量波动有关,而与常见的能量和几何 H 键定义阈值内的适度几何波动相反。排除瞬态断裂的 H 键和瞬态 H 键导致 H 键定义独立的平均寿命和活化能约为 11 kJ/mol,与反应通量方法和实验散射结果一致。此外,我们表明,特定时间 H 键寿命概率分布的幂律衰减与发生在 H 键断裂/形成动力学时间尺度(约 0.1 ps)的旋转和平移运动有关。虽然我们的分析是无扩散的,但在允许 H 键断裂和重新形成、在之间切换受体的情况下,扩散对 H 键概率分布的影响表明,既不会导致指数衰减,也不会导致幂律衰减,类似于反应通量相关函数。