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硅纳米线阵列中热导率的显著降低。

Significant reduction of thermal conductivity in silicon nanowire arrays.

机构信息

Key Laboratory of Beam Technology and Material Modification of the Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, People's Republic of China.

出版信息

Nanotechnology. 2013 Dec 20;24(50):505718. doi: 10.1088/0957-4484/24/50/505718. Epub 2013 Nov 27.

Abstract

Vertically aligned single-crystal silicon nanowire arrays (SiNWs) with various lengths, surface roughnesses and porosities were fabricated with the metal-assisted chemical etching method. Using the laser flash technique and differential scanning calorimetry, we characterized the thermal conductivities of bulk SiNWs/Si/SiNWs sandwich-structured composites (SSCs) at room temperature (300 K). The results demonstrate that the thermal conductivities of SSCs notably decrease with increases in the length, surface roughness and porosity of SiNWs. Furthermore, based on the series thermal-resistance model, we calculated the thermal conductivity of porous SiNWs to be as low as 1.68 W m(-1) K(-1) at 300 K. Considering the remarkable phonon scattering from the diameter, surface roughness and porosity of SiNWs, leading to a significant reduction of the thermal conductivity, SSCs and SiNWs could be applied to high-performance thermoelectric devices.

摘要

采用金属辅助化学刻蚀法制备了具有不同长度、表面粗糙度和孔隙率的垂直排列单晶硅纳米线阵列(SiNWs)。利用激光闪光法和差示扫描量热法,在室温(300 K)下对体硅纳米线/硅/硅纳米线三明治结构复合材料(SSCs)的热导率进行了表征。结果表明,SSCs 的热导率随 SiNWs 长度、表面粗糙度和孔隙率的增加而显著降低。此外,基于串联热阻模型,我们计算出多孔 SiNWs 在 300 K 时的热导率低至 1.68 W m(-1) K(-1)。考虑到 SiNWs 的直径、表面粗糙度和孔隙率对声子散射的显著影响,导致热导率显著降低,SSCs 和 SiNWs 可应用于高性能热电设备。

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