Opt Lett. 2013 Nov 15;38(22):4735-8. doi: 10.1364/OL.38.004735.
Fast and efficient detection of the qubit state in trapped ion systems is critical for implementing quantum error correction and performing fundamental tests such as a loophole-free Bell test. In this work we present a simple qubit state detection protocol for a (171)Yb+ hyperfine atomic qubit trapped in a microfabricated surface trap, enabled by high collection efficiency of the scattered photons and low background photon count rate. We demonstrate average detection times of 10.5, 28.1, and 99.8 μs, corresponding to state detection fidelities of 99%, 99.856(8)%, and 99.915(7)%, respectively.
在囚禁离子系统中快速高效地检测量子位态对于实现量子纠错和进行基本测试（如无漏洞贝尔测试）至关重要。在这项工作中，我们提出了一种简单的量子位态检测协议，用于检测囚禁在微加工表面陷阱中的（171）Yb+超精细原子量子位，该协议得益于散射光子的高收集效率和低背景光子计数率。我们分别演示了平均检测时间为 10.5、28.1 和 99.8 μs 的情况，对应的量子态检测保真度分别为 99%、99.856(8)%和 99.915(7)%。
