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使用商用图像扫描仪对LR115氡探测器进行径迹计数和厚度测量。

Track counting and thickness measurement of LR115 radon detectors using a commercial image scanner.

作者信息

De Cicco F, Pugliese M, Roca V, Sabbarese C

机构信息

Dipartimento di Matematica e Fisica, Seconda Università degli Studi di Napoli, Viale Lincoln, 5-81100 Caserta, Italy.

Dipartimento di Fisica, Università degli studi di Napoli "Federico II", Via Cinthia, 80126 Napoli, Italy INFN, Sezione di Napoli, Via Cinthia, 80126 Napoli, Italy.

出版信息

Radiat Prot Dosimetry. 2014 Dec;162(3):388-93. doi: 10.1093/rpd/nct310. Epub 2013 Dec 9.

Abstract

An original optical method for track counting and film thickness determination of etched LR115 radon detectors was developed. The method offers several advantages compared with standard techniques. In particular, it is non-destructive, very simple and rather inexpensive, since it uses a commercial scanner and a free software. The complete analysis and the calibration procedure carried out for the determination of radon specific activity are reported. A comparison with the results of spark counting defines the accuracy and the precision of the new technique.

摘要

开发了一种用于蚀刻的LR115氡探测器径迹计数和膜厚测定的原始光学方法。与标准技术相比,该方法具有几个优点。特别是,它是非破坏性的,非常简单且成本相当低,因为它使用商用扫描仪和免费软件。报告了为测定氡比活度而进行的完整分析和校准程序。与火花计数结果的比较确定了新技术的准确性和精密度。

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