Department of Chemistry, Georgetown University, Washington, DC, 20057, USA.
J Am Soc Mass Spectrom. 2014 Apr;25(4):692-5. doi: 10.1007/s13361-013-0816-5. Epub 2014 Jan 29.
We present plasma-assisted reaction chemical ionization (PARCI) for elemental analysis of halogens in organic compounds. Organohalogens are broken down to simple halogen-containing molecules (e.g., HBr) in a helium microwave-induced plasma followed by negative mode chemical ionization (CI) in the afterglow region. The reagent ions for CI originate from penning ionization of gases (e.g., N2) introduced into the afterglow region. The performance of PARCI-mass spectrometry (MS) is evaluated using flow injection analyses of organobromines, demonstrating 5-8 times better sensitivities compared with inductively coupled plasma MS. We show that compound-dependent sensitivities in PARCI-MS mainly arise from sample introduction biases.
我们提出了等离子体辅助反应化学电离（PARCI），用于有机化合物中卤素的元素分析。在氦微波诱导等离子体中，将有机卤化物分解为简单的含卤分子（例如 HBr），然后在后燃区进行负离子模式化学电离（CI）。CI 的试剂离子源自引入后燃区的气体（例如 N2）的潘宁电离。使用有机溴化物的流动注射分析评估了 PARCI-质谱（MS）的性能，与电感耦合等离子体质谱（ICP-MS）相比，灵敏度提高了 5-8 倍。我们表明，PARCI-MS 中的化合物依赖性灵敏度主要源于样品引入偏差。
