Paskiewicz D M, Savage D E, Holt M V, Evans P G, Lagally M G
1] Department of Materials Science & Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706 USA [2].
Department of Materials Science & Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706 USA.
Sci Rep. 2014 Feb 27;4:4218. doi: 10.1038/srep04218.
Strained-silicon/relaxed-silicon-germanium alloy (strained-Si/SiGe) heterostructures are the foundation of Group IV-element quantum electronics and quantum computation, but current materials quality limits the reliability and thus the achievable performance of devices. In comparison to conventional approaches, single-crystal SiGe nanomembranes are a promising alternative as substrates for the epitaxial growth of these heterostructures. Because the nanomembrane is truly a single crystal, in contrast to the conventional SiGe substrate made by compositionally grading SiGe grown on bulk Si, significant improvements in quantum electronic-device reliability may be expected with nanomembrane substrates. We compare lateral strain inhomogeneities and the local mosaic structure (crystalline tilt) in strained-Si/SiGe heterostructures that we grow on SiGe nanomembranes and on compositionally graded SiGe substrates, with micro-Raman mapping and nanodiffraction, respectively. Significant structural improvements are found using SiGe nanomembranes.
应变硅/弛豫硅锗合金(应变硅/硅锗)异质结构是IV族元素量子电子学和量子计算的基础,但目前的材料质量限制了器件的可靠性,进而限制了可实现的性能。与传统方法相比,单晶硅锗纳米膜作为这些异质结构外延生长的衬底是一种很有前途的替代方案。由于纳米膜是真正的单晶,与通过在体硅上生长成分渐变的硅锗制成的传统硅锗衬底不同,使用纳米膜衬底有望显著提高量子电子器件的可靠性。我们分别通过微拉曼映射和纳米衍射,比较了在硅锗纳米膜和成分渐变的硅锗衬底上生长的应变硅/硅锗异质结构中的横向应变不均匀性和局部镶嵌结构(晶体倾斜)。使用硅锗纳米膜发现了显著的结构改进。