Cohen E A K, Ober R J
Eric Jonsson School of Electrical Engineering and Computer Science, University of Texas at Dallas, Richardson, TX 75083 USA. He is also with the Department of Mathematics, Imperial College London, SW7 2AZ U.K.
Eric Jonsson School of Electrical Engineering and Computer Science, University of Texas at Dallas, Richardson, TX 75083 USA.
IEEE Trans Signal Process. 2013 Dec 15;61(24):6291-6306. doi: 10.1109/TSP.2013.2284154.
We present an asymptotic treatment of errors involved in point-based image registration where control point (CP) localization is subject to heteroscedastic noise; a suitable model for image registration in fluorescence microscopy. Assuming an affine transform, CPs are used to solve a multivariate regression problem. With measurement errors existing for both sets of CPs this is an problem and linear least squares is inappropriate; the correct method being generalized least squares. To allow for point dependent errors the equivalence of a generalized maximum likelihood and heteroscedastic generalized least squares model is achieved allowing previously published asymptotic results to be extended to image registration. For a particularly useful model of heteroscedastic noise where covariance matrices are scalar multiples of a known matrix (including the case where covariance matrices are multiples of the identity) we provide closed form solutions to estimators and derive their distribution. We consider the (TRE) and define a new measure called the (LRE) believed to be useful, especially in microscopy registration experiments. Assuming Gaussianity of the CP localization errors, it is shown that the asymptotic distribution for the TRE and LRE are themselves Gaussian and the parameterized distributions are derived. Results are successfully applied to registration in single molecule microscopy to derive the key dependence of the TRE and LRE variance on the number of CPs and their associated photon counts. Simulations show asymptotic results are robust for low CP numbers and non-Gaussianity. The method presented here is shown to outperform GLS on real imaging data.
我们提出了一种针对基于点的图像配准中误差的渐近处理方法,其中控制点(CP)定位受到异方差噪声的影响;这是荧光显微镜图像配准的一个合适模型。假设采用仿射变换,控制点用于解决多元回归问题。由于两组控制点都存在测量误差,这是一个问题,线性最小二乘法并不适用;正确的方法是广义最小二乘法。为了考虑与点相关的误差,实现了广义最大似然模型和异方差广义最小二乘模型的等价性,从而使先前发表的渐近结果能够扩展到图像配准。对于一种特别有用的异方差噪声模型,其中协方差矩阵是已知矩阵的标量倍数(包括协方差矩阵是单位矩阵倍数的情况),我们给出了估计量的闭式解并推导了它们的分布。我们考虑了平移配准误差(TRE)并定义了一种新的度量,称为局部配准误差(LRE),认为它是有用的,特别是在显微镜配准实验中。假设控制点定位误差服从高斯分布,结果表明平移配准误差和局部配准误差的渐近分布本身是高斯分布,并推导了参数化分布。结果成功应用于单分子显微镜配准,以得出平移配准误差和局部配准误差方差对控制点数量及其相关光子计数的关键依赖性。模拟表明,对于低控制点数量和非高斯性,渐近结果是稳健的。这里提出的方法在实际成像数据上表现优于广义最小二乘法。