Juluri R R, Rath A, Ghosh A, Bhukta A, Sathyavathi R, Rao D Narayana, Müller Knut, Schowalter Marco, Frank Kristian, Grieb Tim, Krause Florian, Rosenauer A, Satyam P V
Institute of Physics, Sachivalaya Marg, Bhubaneswar, Odisha-751005, India.
1] Institute of Physics, Sachivalaya Marg, Bhubaneswar, Odisha-751005, India [2].
Sci Rep. 2014 Apr 10;4:4633. doi: 10.1038/srep04633.
Surface enhanced Raman spectroscopy (SERS) has been established as a powerful tool to detect very low-concentration bio-molecules. One of the challenging problems is to have reliable and robust SERS substrate. Here, we report on a simple method to grow coherently embedded (endotaxial) silver nanostructures in silicon substrates, analyze their three-dimensional shape by scanning transmission electron microscopy tomography and demonstrate their use as a highly reproducible and stable substrate for SERS measurements. Bi-layers consisting of Ag and GeOx thin films were grown on native oxide covered silicon substrate using a physical vapor deposition method. Followed by annealing at 800°C under ambient conditions, this resulted in the formation of endotaxial Ag nanostructures of specific shape depending upon the substrate orientation. These structures are utilized for detection of Crystal Violet molecules of 5 × 10(-10) M concentrations. These are expected to be one of the highly robust, reusable and novel substrates for single molecule detection.
表面增强拉曼光谱(SERS)已成为检测极低浓度生物分子的强大工具。其中一个具有挑战性的问题是拥有可靠且稳定的SERS基底。在此,我们报道一种在硅基底中生长相干嵌入(外延)银纳米结构的简单方法,通过扫描透射电子显微镜断层扫描分析其三维形状,并展示其作为用于SERS测量的高度可重复且稳定的基底的用途。使用物理气相沉积法在天然氧化物覆盖的硅基底上生长由Ag和GeOx薄膜组成的双层膜。随后在环境条件下于800°C退火,这导致根据基底取向形成特定形状的外延银纳米结构。这些结构用于检测浓度为5×10(-10) M的结晶紫分子。这些有望成为用于单分子检测的高度稳定、可重复使用的新型基底之一。