Department of Mechanical Engineering and Applied Mechanics, University of Pennsylvania , Philadelphia, Pennsylvania 19104, United States.
ACS Nano. 2014 Jul 22;8(7):7027-40. doi: 10.1021/nn501896e. Epub 2014 Jun 25.
In this study, we explore the wear behavior of amplitude modulation atomic force microscopy (AM-AFM, an intermittent-contact AFM mode) tips coated with a common type of diamond-like carbon, amorphous hydrogenated carbon (a-C:H), when scanned against an ultra-nanocrystalline diamond (UNCD) sample both experimentally and through molecular dynamics (MD) simulations. Finite element analysis is utilized in a unique way to create a representative geometry of the tip to be simulated in MD. To conduct consistent and quantitative experiments, we apply a protocol that involves determining the tip-sample interaction geometry, calculating the tip-sample force and normal contact stress over the course of the wear test, and precisely quantifying the wear volume using high-resolution transmission electron microscopy imaging. The results reveal gradual wear of a-C:H with no sign of fracture or plastic deformation. The wear rate of a-C:H is consistent with a reaction-rate-based wear theory, which predicts an exponential dependence of the rate of atom removal on the average normal contact stress. From this, kinetic parameters governing the wear process are estimated. MD simulations of an a-C:H tip, whose radius is comparable to the tip radii used in experiments, making contact with a UNCD sample multiple times exhibit an atomic-level removal process. The atomistic wear events observed in the simulations are correlated with under-coordinated atomic species at the contacting surfaces.
在这项研究中,我们通过实验和分子动力学(MD)模拟,探索了涂覆有常见类型的类金刚石碳(非晶氢化碳,a-C:H)的振幅调制原子力显微镜(AM-AFM,一种间歇接触 AFM 模式)探针在与超纳米晶金刚石(UNCD)样品相互作用时的磨损行为。有限元分析以一种独特的方式被用于创建一个在 MD 中模拟的代表性探针几何形状。为了进行一致和定量的实验,我们应用了一种方案,包括确定探针-样品相互作用的几何形状,计算磨损测试过程中的探针-样品力和法向接触应力,并使用高分辨率透射电子显微镜成像精确地量化磨损体积。结果表明,a-C:H 逐渐磨损,没有断裂或塑性变形的迹象。a-C:H 的磨损率与基于反应速率的磨损理论一致,该理论预测原子去除率与平均法向接触应力呈指数关系。由此,估计了控制磨损过程的动力学参数。对半径与实验中使用的探针半径相当的 a-C:H 探针与 UNCD 样品多次接触的 MD 模拟显示出原子级别的去除过程。在模拟中观察到的原子级磨损事件与接触表面上配位不足的原子种类有关。