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硅的电偶/金属辅助刻蚀机制。

The mechanism of galvanic/metal-assisted etching of silicon.

机构信息

Department of Chemistry, West Chester University, West Chester, PA 19383-2115, USA.

出版信息

Nanoscale Res Lett. 2014 Aug 26;9(1):432. doi: 10.1186/1556-276X-9-432. eCollection 2014.

Abstract

Metal-assisted etching is initiated by hole injection from an oxidant catalyzed by a metal nanoparticle or film on a Si surface. It is shown that the electronic structure of the metal/Si interface, i.e., band bending, is not conducive to diffusion of the injected hole away from the metal in the case of Ag or away from the metal/Si interface in the cases of Au, Pd, and Pt. Since holes do not diffuse away from the metals, the electric field resulting from charging of the metal after hole injection must instead be the cause of metal-assisted etching.

摘要

金属辅助刻蚀是由氧化剂在 Si 表面的金属纳米颗粒或薄膜催化下产生的空穴注入引发的。研究表明,金属/Si 界面的电子结构,即能带弯曲,不利于注入空穴从金属(Ag)中或从金属/Si 界面(Au、Pd 和 Pt)中扩散。由于空穴不会从金属中扩散出去,因此在空穴注入后金属充电产生的电场必然是金属辅助刻蚀的原因。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/4c05/4149979/bc852302d60c/1556-276X-9-432-1.jpg

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