Rapino Stefania, Treossi Emanuele, Palermo Vincenzo, Marcaccio Massimo, Paolucci Francesco, Zerbetto Francesco
Dipartimento di Chimica G. Ciamician, Via F. Selmi 2, 40126 Bologna, Italy.
Chem Commun (Camb). 2014 Nov 7;50(86):13117-20. doi: 10.1039/c4cc06368f.
Scanning electrochemical microscopy (SECM) can image graphene oxide (GO) flakes on insulating and conducting substrates. The contrast between GO and the substrate is controlled by the electrostatic interactions that are established between the charges of the molecular redox mediator and the charges present in the sheet/substrate. SECM also allows quantitative measurement - at the nano/microscale - of the charge transfer kinetics between single monolayer sheets and agent molecules.
扫描电化学显微镜（SECM）可以对绝缘和导电基底上的氧化石墨烯（GO）薄片进行成像。GO与基底之间的对比度由分子氧化还原介质的电荷与薄片/基底中存在的电荷之间建立的静电相互作用控制。SECM还允许在纳米/微米尺度上对单个单层薄片与试剂分子之间的电荷转移动力学进行定量测量。
