Department of Materials Science and Engineering, University of California, Berkeley, California 94720, USA.
The Makineni Theoretical Laboratories, Department of Chemistry, University of Pennsylvania, Philadelphia, Pennsylvania 19104-6323, USA.
Nat Mater. 2015 Jan;14(1):79-86. doi: 10.1038/nmat4119. Epub 2014 Oct 26.
Switchable polarization makes ferroelectrics a critical component in memories, actuators and electro-optic devices, and potential candidates for nanoelectronics. Although many studies of ferroelectric switching have been undertaken, much remains to be understood about switching in complex domain structures and in devices. In this work, a combination of thin-film epitaxy, macro- and nanoscale property and switching characterization, and molecular dynamics simulations are used to elucidate the nature of switching in PbZr(0.2)Ti(0.8)O3 thin films. Differences are demonstrated between (001)-/(101)- and (111)-oriented films, with the latter exhibiting complex, nanotwinned ferroelectric domain structures with high densities of 90° domain walls and considerably broadened switching characteristics. Molecular dynamics simulations predict both 180° (for (001)-/(101)-oriented films) and 90° multi-step switching (for (111)-oriented films) and these processes are subsequently observed in stroboscopic piezoresponse force microscopy. These results have implications for our understanding of ferroelectric switching and offer opportunities to change domain reversal speed.
可切换极化使铁电体成为存储器、致动器和电光器件的关键组成部分,也是纳米电子学的潜在候选者。尽管已经对铁电体的切换进行了许多研究,但对于复杂畴结构和器件中的切换仍有许多需要了解的地方。在这项工作中,采用了薄膜外延、宏观和纳米尺度的性能和切换特性以及分子动力学模拟的组合,以阐明 PbZr(0.2)Ti(0.8)O3 薄膜中切换的性质。(001)/(101)和(111)取向薄膜之间表现出差异,后者表现出复杂的、具有纳米孪晶的铁电畴结构,具有高密度的 90°畴壁和相当宽的切换特性。分子动力学模拟预测了 180°(对于(001)/(101)取向的薄膜)和 90°多步切换(对于(111)取向的薄膜),并且随后在频闪压电力显微镜中观察到了这些过程。这些结果对我们理解铁电体的切换具有重要意义,并为改变畴反转速度提供了机会。