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硅电极中表面氧化物在锂离子电池固体电解质界面相形成中的作用。

Role of surface oxides in the formation of solid-electrolyte interphases at silicon electrodes for lithium-ion batteries.

机构信息

Materials Science & Engineering Program, Texas Materials Institute, ‡Center for Nano- and Molecular Science and Technology, §Department of Chemistry, The University of Texas at Austin , Austin, Texas 78712, United States.

出版信息

ACS Appl Mater Interfaces. 2014 Dec 10;6(23):21510-24. doi: 10.1021/am506517j. Epub 2014 Nov 26.

Abstract

Nonaqueous solvents in modern battery technologies undergo electroreduction at negative electrodes, leading to the formation of a solid-electrolyte interphase (SEI). The mechanisms and reactions leading to a stable SEI on silicon electrodes in lithium-ion batteries are still poorly understood. This lack of understanding inhibits the rational design of electrolyte additives, active material coatings, and the prediction of Li-ion battery life in general. We prepared SEI with a common nonaqueous solvent (LiPF6 in PC and in EC/DEC 1:1 by wt %) on silicon oxide and etched silicon (001) surfaces in various states of lithiation to understand the role of surface chemistry on the SEI formation mechanism and SEI structure. Anhydrous and anoxic techniques were used to prevent air and moisture contamination of prepared SEI films, allowing for more accurate characterization of SEI chemical stratification and composition by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) depth profiling. Additionally, multivariate statistical methods were used to better understand TOF-SIMS depth profiling studies. We conclude that the absence of native-oxide layer on silicon has a significant impact on the formation, composition, structure, and thickness of the SEI.

摘要

在现代电池技术中,非水溶剂在负极发生电化学还原,导致形成固体电解质界面(SEI)。锂离子电池中硅电极上形成稳定 SEI 的机制和反应仍未被充分理解。这种理解的缺乏阻碍了电解质添加剂、活性材料涂层的合理设计以及锂离子电池寿命的预测。我们在氧化硅和不同锂化状态的硅(001)表面上用常见的非水溶剂(PC 中的 LiPF6 和按重量比 1:1 的 EC/DEC)制备了 SEI,以了解表面化学对 SEI 形成机制和 SEI 结构的作用。我们使用无水和无氧技术来防止制备的 SEI 薄膜受到空气和水分的污染,从而通过 X 射线光电子能谱(XPS)和飞行时间二次离子质谱(TOF-SIMS)深度剖析更准确地表征 SEI 的化学分层和组成。此外,我们还使用多元统计方法来更好地理解 TOF-SIMS 深度剖析研究。我们得出结论,硅表面不存在本征氧化层对 SEI 的形成、组成、结构和厚度有重大影响。

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