Chen Chunguang, Zhou Tao, Danilov Dmitri L, Gao Lu, Benning Svenja, Schön Nino, Tardif Samuel, Simons Hugh, Hausen Florian, Schülli Tobias U, Eichel R-A, Notten Peter H L
IEK-9, Forschungszentrum Jülich, D-52425, Jülich, Germany.
Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands.
Nat Commun. 2020 Jul 1;11(1):3283. doi: 10.1038/s41467-020-17104-9.
While intensive efforts have been devoted to studying the nature of the solid-electrolyte interphase (SEI), little attention has been paid to understanding its role in the mechanical failures of electrodes. Here we unveil the impact of SEI inhomogeneities on early-stage defect formation in Si electrodes. Buried under the SEI, these early-stage defects are inaccessible by most surface-probing techniques. With operando full field diffraction X-ray microscopy, we observe the formation of these defects in real time and connect their origin to a heterogeneous degree of lithiation. This heterogeneous lithiation is further correlated to inhomogeneities in topography and lithium-ion mobility in both the inner- and outer-SEI, thanks to a combination of operando atomic force microscopy, electrochemical strain microscopy and sputter-etched X-ray photoelectron spectroscopy. Our multi-modal study bridges observations across the multi-level interfaces (Si/LiSi/inner-SEI/outer-SEI), thus offering novel insights into the impact of SEI homogeneities on the structural stability of Si-based lithium-ion batteries.
尽管人们已投入大量精力研究固体电解质界面(SEI)的性质,但对其在电极机械故障中的作用却关注甚少。在此,我们揭示了SEI不均匀性对硅电极早期缺陷形成的影响。这些早期缺陷埋在SEI之下,大多数表面探测技术无法检测到。通过原位全场衍射X射线显微镜,我们实时观察到这些缺陷的形成,并将其起源与不均匀的锂化程度联系起来。由于原位原子力显微镜、电化学应变显微镜和溅射蚀刻X射线光电子能谱的结合,这种不均匀锂化进一步与内、外SEI中的形貌和锂离子迁移率的不均匀性相关。我们的多模态研究跨越了多级界面(硅/锂硅/内SEI/外SEI)进行观察,从而为SEI均匀性对硅基锂离子电池结构稳定性的影响提供了新的见解。