Department of Botany and Plant Pathology, Oregon State University, Corvallis, OR, 97331, USA,
Theor Appl Genet. 2015 Feb;128(2):329-41. doi: 10.1007/s00122-014-2433-5. Epub 2014 Nov 29.
Identification of genome regions linked to Cephalosporium stripe resistance across two populations on chromosome 3BS, 4BS, 5AL, C5BL. Results were compared to a similar previous study. Cephalosporium stripe is a vascular wilt disease of winter wheat (Triticum aestivum L.) caused by the soil-borne fungus Cephalosporium gramineum Nisikado & Ikata. In the USA it is known to be a recurring disease when susceptible cultivars are grown in the wheat-growing region of Midwest and Pacific Northwest. There is no complete resistance in commercial wheat cultivars, although the use of moderately resistant cultivars reduces the disease severity and the amount of inoculum in subsequent seasons. The goal of this study was to detect and to compare chromosomal regions for resistance to Cephalosporium stripe in two winter wheat populations. Field inoculation was performed and Cephalosporium stripe severity was visually scored as percent of prematurely ripening heads (whiteheads) per plot. 'Tubbs'/'NSA-98-0995' and 'Einstein'/'Tubbs', each comprising a cross of a resistant and a susceptible cultivar, with population sizes of 271 and 259 F (5:6) recombinant inbred lines, respectively, were genotyped and phenotyped across four environments. In the quantitative trait loci (QTL) analysis, six and nine QTL were found, explaining in total, around 30 and 50 % of the phenotypic variation in 'Tubbs'/'NSA-98-0995' and 'Einstein'/'Tubbs', respectively. The QTL with the largest effect from both 'NSA-98-0995' and 'Einstein' was on chromosome 5AL.1 and linked to marker gwm291. Several QTL with smaller effects were identified in both populations on chromosomes 5AL, 6BS, and 3BS, along with other QTL identified in just one population. These results indicate that resistance to Cephalosporium stripe in both mapping populations was of a quantitative nature.
鉴定与两个群体的 3BS、4BS、5AL 和 C5BL 上的头孢条纹抗性相关的基因组区域。结果与之前的类似研究进行了比较。头孢条纹是一种由土壤传播的真菌头孢菌(Cephalosporium gramineum Nisikado & Ikata)引起的冬小麦(Triticum aestivum L.)维管束萎蔫病。在美国,当易感品种在中西部和太平洋西北地区的小麦种植区种植时,已知其为一种复发性疾病。虽然使用中度抗性品种可降低疾病严重程度和后续季节的接种量,但商业小麦品种中不存在完全抗性。本研究的目的是检测和比较两个冬小麦群体中头孢条纹抗性的染色体区域。进行田间接种,根据每个小区提前成熟的头部(白头)的百分比,对头孢条纹严重程度进行视觉评分。“Tubbs”/“NSA-98-0995”和“Einstein”/“Tubbs”分别由一个抗性和一个易感品种杂交组成,群体大小分别为 271 和 259 个 F(5:6)重组自交系,在四个环境中进行了基因型和表型分析。在数量性状位点(QTL)分析中,在“Tubbs”/“NSA-98-0995”和“Einstein”/“Tubbs”中分别发现了 6 个和 9 个 QTL,共解释了约 30%和 50%的表型变异。来自“NSA-98-0995”和“Einstein”的最大效应 QTL位于 5AL.1 染色体上,与标记 gwm291 连锁。在两个群体中,在 5AL、6BS 和 3BS 染色体上以及仅在一个群体中鉴定到的其他 QTL 上,鉴定到了几个较小效应的 QTL。这些结果表明,两个作图群体对头孢条纹的抗性均为数量性状。