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通过光学饱和跃迁进行图案化——制造与表征

Patterning via optical saturable transitions--fabrication and characterization.

作者信息

Cantu Precious, Andrew Trisha L, Menon Rajesh

机构信息

Department of Electrical and Computer Engineering, The University of Utah;

Department of Chemistry, The University of Wisconsin-Madison.

出版信息

J Vis Exp. 2014 Dec 11(94):52449. doi: 10.3791/52449.

Abstract

This protocol describes the fabrication and characterization of nanostructures using a novel nanolithographic technique called Patterning via Optical Saturable Transitions (POST). In this technique the chemical properties of organic photochromic molecules that undergo single-photon reactions are exploited, enabling rapid top-down nanopatterning over large areas at low light intensities, thereby, allowing for the circumvention of the far-field diffraction barrier.(4) Simple, cost-effective, high throughput and resolution alternatives to nanopatterning are being explored, such as, two-photon polymerization(5,6), beam pen lithography (BPL)(7), scanning electron beam lithography (SEBL), and focused ion beam (FIB) patterning. However, multi-photon approaches require high light intensities, which limit their potential for high throughput and offer low image contrast. Although, electron and ion beam lithographic processes offer increased resolution, the serial nature of the process is limited to slow writing speeds, which also prevents patterning of features over large areas. Beam-pen lithography is an approach towards parallel near-field optical lithography. However, the gap between the source of the beam and the surface of the photoresist needs to be controlled extremely precisely for good pattern uniformity and this is very challenging to accomplish for large arrays of beams. Patterning via Optical Saturable Transitions (POST) is an alternative optical nanopatterning technique for patterning sub-wavelength features(1-3). Since this technique uses single photons instead of electrons, it is extremely fast and does not require high light intensities(1-3), opening the door to massive parallelization.

摘要

本协议描述了使用一种名为“通过光学饱和跃迁进行图案化(POST)”的新型纳米光刻技术制造和表征纳米结构的方法。在该技术中,利用了经历单光子反应的有机光致变色分子的化学性质,能够在低光强度下在大面积上进行快速的自上而下的纳米图案化,从而规避远场衍射障碍。(4)正在探索用于纳米图案化的简单、经济高效、高通量和高分辨率的替代方法,例如双光子聚合(5,6)、束笔光刻(BPL)(7)、扫描电子束光刻(SEBL)和聚焦离子束(FIB)图案化。然而,多光子方法需要高光照强度,这限制了它们的高通量潜力并提供低图像对比度。尽管电子束和离子束光刻工艺具有更高的分辨率,但该工艺的串行性质限制了写入速度,这也阻碍了在大面积上对特征进行图案化。束笔光刻是一种实现平行近场光学光刻的方法。然而为了获得良好的图案均匀性,光束源与光刻胶表面之间的间隙需要极其精确地控制,而对于大量光束阵列来说这极具挑战性。通过光学饱和跃迁进行图案化(POST)是一种用于对亚波长特征进行图案化的替代光学纳米光刻技术(1 - 3)。由于该技术使用单光子而非电子,因此速度极快且不需要高光照强度(1 - 3),为大规模并行化打开了大门。

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